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Volumn 54, Issue 18, 2006, Pages 4731-4743

Growth, structure, and tribological behavior of atomic layer-deposited tungsten disulphide solid lubricant coatings with applications to MEMS

Author keywords

Atomic layer deposition (ALD); Crystal growth; High resolution electron microscopy (HREM); Internal friction; Wear

Indexed keywords

ADSORPTION; COMPUTER SOFTWARE; CRYSTAL GROWTH; CRYSTALLINE MATERIALS; HIGH RESOLUTION ELECTRON MICROSCOPY; INTERNAL FRICTION; MICROELECTROMECHANICAL DEVICES; NANOSTRUCTURED MATERIALS; POLYSILICON; SHEAR STRESS; STAINLESS STEEL; TRANSMISSION ELECTRON MICROSCOPY; TUNGSTEN COMPOUNDS; WEAR OF MATERIALS; X RAY DIFFRACTION ANALYSIS;

EID: 33748972674     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2006.06.009     Document Type: Article
Times cited : (187)

References (53)
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    • Brainard WA. NASA TN D5141; 1969.
  • 23
    • 0032670035 scopus 로고    scopus 로고
    • Tanner DM, Walraven JA, Irwin LW, Dugger MT, Smith NF, Eaton WP, et al. In: Proceedings of the IEEE International Reliability Physics (1999), San Diego (CA), 1999; p. 189.
  • 29
    • 0000836443 scopus 로고    scopus 로고
    • Nalwa H.S. (Ed), Academic Press, San Diego (CA)
    • Ritala M., and Leskela M. In: Nalwa H.S. (Ed). Handbook of thin films (2002), Academic Press, San Diego (CA) 103
    • (2002) Handbook of thin films , pp. 103
    • Ritala, M.1    Leskela, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.