Scanning transmission electron microscopy and its application to the study of nanoparticles and nanoparticle systems

Journal of Electron Microscopy

Volumn 54, Issue 3, 2005, Pages 251-278

  Liu, Jingyue ^a  

^a MONSANTO COMPANY   (United States)

Author keywords

Auger; EDS; EELS; Electron microscopy; Nanodiffraction; Nanoparticle; SEM; STEM; Supported catalyst; Surface; Z contrast microscopy

Indexed keywords

DIFFRACTION; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONIC STATES; ELECTRONS; ENERGY DISPERSIVE SPECTROSCOPY; FIELD EMISSION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; NANOCATALYSTS; NANOPARTICLES;

AUGE; IMAGING INFORMATION; ITS APPLICATIONS; MICROSCOPY TECHNIQUE; NANODIFFRACTION; NANOPARTICLE SYSTEMS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SUB NANOMETERS; Z CONTRASTS; Z-CONTRAST MICROSCOPY;

SCANNING ELECTRON MICROSCOPY;

EID: 27744433837     PISSN: 00220744     EISSN: 14779986     Source Type: Journal    
DOI: 10.1093/jmicro/dfi034     Document Type: Review

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