The imaging properties of atomic focusers

Ultramicroscopy

Volumn 72, Issue 3-4, 1998, Pages 213-222

  Sanchez, Michael ^a,b   Cowley, J M ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

^b University of Illinois at Urbana Champaign   (United States)

Author keywords

Electron microscope design and characterization; High resolution transmission electron microscopy

Indexed keywords

ATOMS; COMPUTER SIMULATION; CRYSTALS; DESIGN; ELECTRON MICROSCOPES; GOLD; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON MICROSCOPY;

ARTICLE; IMAGE ANALYSIS; IMAGE RECONSTRUCTION; SCANNING ELECTRON MICROSCOPY; SIMULATION; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0032078231     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(98)00018-7     Document Type: Article

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