Ultra-high resolution with off-axis STEM holography

Ultramicroscopy

Volumn 96, Issue 2, 2003, Pages 163-166

  Cowley, J M ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

Author keywords

Contrast transfer theory; Electron holography; STEM

Indexed keywords

DIFFRACTION; ELECTRON HOLOGRAPHY; OPTICAL RESOLVING POWER; PATTERN RECOGNITION; TRANSMISSION ELECTRON MICROSCOPY;

ULTRAMICROSCOPY;

SCANNING ELECTRON MICROSCOPY;

ACCURACY; ANALYTIC METHOD; ARTICLE; HOLOGRAPHY; IMAGE ANALYSIS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; THEORY;

EID: 0037411766     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(03)00003-2     Document Type: Article

References (5)

1. Cowley J.M., Winterton J. Phys. Rev. Lett. 87:2001;016101.
2. McCallum B.C., Rodenburg J.D. Ultramicroscopy. 45:1992;371.
3. Rodenburg J.D., McCallum B.C., Nellist P.D. Ultramicroscopy. 48:1993;304.
4. Cowley J.M. Ultramicroscopy. 87:2001;1.
5. Cowley J.M. Cheremisinoff N.P., Cheremisinoff P.N. Handbook of Advanced Materials Testing. 1995;155 Marcel Dekker, New York.