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Ultramicroscopy

Volumn 90, Issue 2-3, 2002, Pages 197-206

Electron nanodiffraction methods for measuring medium-range order

(1) Cowley, J M a

a ARIZONA STATE UNIVERSITY (United States)

Author keywords

Electron nanodiffraction; Medium range order; Scanning transmission electron microscopy; Thin amorphous films

Indexed keywords

AMORPHOUS MATERIALS; CORRELATION METHODS; ELECTRON DIFFRACTION; MICROSCOPIC EXAMINATION; TRANSMISSION ELECTRON MICROSCOPY;

DISORDERED MATERIALS;

THIN FILMS;

CARBON; NANOPARTICLE; SILICON DIOXIDE; SILICON NITRIDE;

ANALYTIC METHOD; ARTICLE; ATOM; CORRELATION ANALYSIS; ELECTRON BEAM; ELECTRON DIFFRACTION; ELECTRON MICROSCOPE; FILM; MEASUREMENT; PARTICLE SIZE; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

EID: 0036189446 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/S0304-3991(01)00130-9 Document Type: Article

Times cited : (42)

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