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Volumn 4, Issue 3, 1997, Pages 567-575

Applications of STEM instruments for surface studies

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0031321394     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218625X97000559     Document Type: Article
Times cited : (4)

References (49)
  • 3
    • 3142590006 scopus 로고
    • ed. J. M. Cowley Oxford University Press, Oxford
    • K. Yagi, in Electron Diffraction Techniques, Vol. 2, ed. J. M. Cowley (Oxford University Press, Oxford, 1993), p. 260.
    • (1993) Electron Diffraction Techniques , vol.2 , pp. 260
    • Yagi, K.1
  • 4
    • 0026690910 scopus 로고
    • and the associated papers
    • T. Hsu, Micros. Res. Tech. 20, 318 (1992) and the associated papers.
    • (1992) Micros. Res. Tech. , vol.20 , pp. 318
    • Hsu, T.1
  • 8
    • 3342981656 scopus 로고
    • High-resolution electron microscopy of surfaces
    • eds. W. Schommers and P. von Blanckenhagen Springer-Verlag, Berlin
    • L. D. Marks, "High-resolution electron microscopy of surfaces," in Topics of Current Physics, Vol. 41, eds. W. Schommers and P. von Blanckenhagen (Springer-Verlag, Berlin, 1986).
    • (1986) Topics of Current Physics , vol.41
    • Marks, L.D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.