Demonstration of atomic resolution Z-contrast imaging by a JEOL JEM-2010F scanning transmission electron microscope

Journal of Electron Microscopy

Volumn 47, Issue 6, 1998, Pages 561-574

  James, E M ^a   Browning, N D ^a   Nicholls, A W ^a   Kawasaki, M ^b   Xin, Y ^a   Stemmer, S ^a  

^a UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

^b JEOL LTD   (Japan)

Author keywords

Atomic resolution Z contrast imaging; Scanning transmission electron microscope

Indexed keywords

ABERRATIONS; ASPHERICS; ATOMS; ELECTRON DIFFRACTION; ELECTRON GUNS; ELECTRONS; IMAGE RESOLUTION;

ATOMIC RESOLUTION Z-CONTRAST IMAGING; ATOMIC-RESOLUTION; DARK-FIELD DETECTORS; MICRO ANALYSIS; RESOLUTION LIMITS; SCANNING TRANSMISSION ELECTRON MICROSCOPES; SCHOTTKY EMISSIONS; SPATIAL RESOLUTION; Z-CONTRAST IMAGES; Z-CONTRAST IMAGING;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 0032438782     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023629     Document Type: Article

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