The enhancement of electron microscope resolution by use of atomic focusers

Ultramicroscopy

Volumn 68, Issue 2, 1997, Pages 135-148

  Cowley, J M ^a   Spence, J C H ^a   Smirnov, Valery V ^b  

^a ARIZONA STATE UNIVERSITY   (United States)

^b ST PETERSBURG STATE UNIVERSITY   (Russian Federation)

Author keywords

Electron microscope design and characterization; High resolution transmission electron microscopy; Scanning transmission electron microscopy; Specimen preparation and handling

Indexed keywords

SCANNING ELECTRON MICROSCOPY; SPECIMEN PREPARATION;

ATOMIC FOCUSERS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

TRANSMISSION ELECTRON MICROSCOPY;

ARTICLE; ELECTRON BEAM; IMAGE QUALITY; OPTICAL RESOLUTION; SAMPLING; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0031570709     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00022-3     Document Type: Article

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