Conditions and reasons for incoherent imaging in STEM

Ultramicroscopy

Volumn 63, Issue 2, 1996, Pages 93-114

  Hartel, P ^a   Rose, H ^a   Dinges, C ^a  

^a DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ATOMS; DETECTORS; ELECTRONS; FOURIER TRANSFORMS; SCANNING ELECTRON MICROSCOPY; TRANSFER FUNCTIONS; TRANSMISSION ELECTRON MICROSCOPY;

DEGREE OF COHERENCE; IMAGE INTENSITY; INCOHERENT IMAGING; MODULATION TRANSFER FUNCTION; SCANNING TRANSMISSION ELECTRON MICROSCOPY; THERMAL VIBRATIONS;

IMAGING TECHNIQUES;

ELECTRON MICROSCOPY; IMAGING SYSTEM; REVIEW; SCANNING ELECTRON MICROSCOPY;

EID: 0030175197     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/0304-3991(96)00020-4     Document Type: Article

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