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Journal of Electron Microscopy

Volumn 50, Issue 3, 2001, Pages 227-233

On the origin of transverse incoherence in Z-contrast STEM

(3) Rafferty, B a,c Nellist, D b,d Pennycook, J a

a OAK RIDGE NATIONAL LABORATORY (United States)

b UNIVERSITY OF BIRMINGHAM (United Kingdom)

c Leica Microsystems Lithography Ltd (United Kingdom)

d Nion Co Kirkland (United States)

Author keywords

ADF; Bloch waves; Imaging theory; Scanning transmission electron microscopy; Thermal diffuse scattering; Z contrast

Indexed keywords

ARTICLE;

COHERENT SCATTERING; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; INCOHERENT SCATTERING; SCANNING ELECTRON MICROSCOPY;

ADF; BLOCH WAVES; DIFFUSE SCATTERING; IMAGING THEORY; SCANNING TRANSMISSION ELECTRON MICROSCOPY; THERMAL; THERMAL DIFFUSE SCATTERING; WAVE APPROACH; Z CONTRASTS; Z-CONTRAST IMAGING;

ELASTIC SCATTERING;

EID: 0034929843 PISSN: 00220744 EISSN: None Source Type: Journal
DOI: 10.1093/jmicro/50.3.227 Document Type: Article

Times cited : (60)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.