Imaging of light-atom nanocrystals with a thin annular detector in STEM

Ultramicroscopy

Volumn 65, Issue 1-2, 1996, Pages 61-70

  Cowley, J M ^a,b   Merkulov, V I ^a,b   Lannin, J S ^a,b  

^a ARIZONA STATE UNIVERSITY   (United States)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; CRYSTAL ATOMIC STRUCTURE; CRYSTALLINE MATERIALS; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; ELECTRON SCATTERING; IMAGING TECHNIQUES; OPTICAL RESOLVING POWER; SILICA;

DARK FIELD IMAGING; LIGHT ATOM NANOCRYSTALS;

NANOSTRUCTURED MATERIALS;

ARTICLE; ELECTRON MICROSCOPY;

EID: 0030250564     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(96)00056-3     Document Type: Article

References (13)

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