Electron nanodiffraction: Progress and prospects

Journal of Electron Microscopy

Volumn 45, Issue 1, 1996, Pages 3-10

  Cowley, J M ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

Author keywords

Carbon nanotubes; Coherence; Electron holography; Electron nanodiffraction; Ptychography

Indexed keywords

DIFFRACTION PATTERNS; ELECTRON DIFFRACTION; ELECTRONS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; HOLOGRAMS; HOLOGRAPHIC INTERFEROMETRY; IMAGE ENHANCEMENT; IMAGE RESOLUTION; SCANNING ELECTRON MICROSCOPY;

BEAM CONVERGENCE; COHERENT INTERFERENCE; ELECTRON DIFFRACTION PATTERN; ELECTRON NANODIFFRACTION; FIELD EMISSION GUNS; FINE STRUCTURES; INCIDENT BEAMS; PTYCHOGRAPHY; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SPECIMEN STRUCTURES;

ELECTRON HOLOGRAPHY;

EID: 0001956754     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023409     Document Type: Article

References (45)

1. Crewe AV, Wall J, Welter LM: A high-resolution scanning transmission electron microscope. J Appl Phys 39: 5861-5868 (1968)
2. Brown LM, Craven AJ, Jones LPG, Griffith A, Stobbs WM, Wilson CJ: Application of a high-resolution STEM to materials science. In: Scanning electron microscopy/1976. Part II. Chicago: IIT Research Inst. 353-360 (1976)
3. Chevalier J-PAA, Craven AJ: Microdiffraction - Application to short-range order in quenched copper-platinum alloy. Phil Mag 36: 67-79 (1977)
4. Cowley JM, Ou H-J: Observation of microdiffraction patterns with a dedicated STEM instrument. J Electron Micros Tech 11: 143-154 (1980)
5. Cowley J: Configured detectors for STEM imaging of thin specimens. Ultramicroscopy 49: 4-13 (1993)
6. Venables JA, Cowley JM, von Harrach HS: A field-emission STEM for surface strudies. In: Proc. EMAG 87: Institute of Physics conf. ser. 90: 85-88 (1987)
7. Hembree GG, Crozier PA, Drucker JS, Krishnamurthy M, Venables JA, Cowley JM: Based secondary electron imaging in a UHV-STEM. Ultramicroscopy 31: 111-115 (1989)
8. Hembree GG, Drucker JS, Luo FCH, Krishnamurthy M, Venables JA: Auger electron spectroscopy and microscopy with probe-size limited resolution. Appl Phys Lett 58: 1890-1892 (1991)
9. Spence JCH, Cowley JM: Lattice imaging in STEM. Optik 50: 129-142 (1978)
10. Monosmith WB, Cowley JM: Electron diffraction from very small gold particles. Ultramicroscopy 12: 177-184 (1984)
11. Cowley JM, Plano RJ: A microdiffraction study of gold-ruthenium catalyst particles. J Catalysis 108: 199-207 (1987)
12. Iijima S: Helical microtubules of graphitic carbon. Nature 354: 56-58 (1991)
13. Liu M, Cowley JM: Structures of the helical carbon nanotubes. Carbon 32: 393-403 (1994)
14. Cowley JM, Liu M: The structure of carbon nanotubes impregnated with yttrium. Micron 25: 53-61 (1994)
15. Liu M, Cowley JM: Encapsulation of lanthanum carbide in carbon nanotubes and nanoparticles. Carbon 33: 225-232 (1995)
16. Liu M, Cowley JM: Structure of carbon nanontubes studied by HRTEM and nanodiffraction. Ultramicroscopy 53: 333-342 (1994)
17. Konnert J, D'Antonio P: Image reconstruction using electron microdiffraction patterns from overlapping regions. Ultramicroscopy 19: 267-278 (1986)
18. Hÿtch MJ, Chevalier JP: On the breakdown of Friedel's Law for coherent microdiffraction from amorphous materials. Ultramicroscopy 58: 114-121 (1995)
19. Cowley JM, Spence JCH: Convergent beam electron microdiffraction from small crystals. Ultramicroscopy 6: 359-366 (1981)
20. Pan M, Cowley JM, Barry JC: Coherent electron microdiffraction from small metal particles. Ultramicroscopy 30: 385-394 (1989)
21. 3Au. Acta Crystallog A 38: 718-724 (1982)
22. Zhu J, Cowley JM: Microdiffraction from stacking faults and twin boundaries in F.C.C. crystals. J Appl Cryst 16: 171-175 (1983)
23. Zhu J, Ye HQ, Cowley JM: Effect of anti-phase domain boundaries on microdiffraction: Computer simulation. Ultramicroscopy 18: 111-116 (1985)
24. Gajdardziska-Josifovska M, Weiss JK, Cowley JM: Studies of Mo/Si multilayers with coherent electron beams. Utramicroscopy 58: 65-78 (1995)
25. Spence JCH, Zuo JM: Electron microdiffraction. New York: Plenum Press (1992)
26. Vine WJ, Vincent R, Spellward P, Steeds JW: Observation of phase contrast in convergent-beam electron diffraction patterns. Ultramicroscopy 41: 423-428 (1992)
27. Tanaka M, Terauchi M, Tsuda K: Convergent-beam electron diffraction III. Tokyo: JEOL Ltd. 207-249 (1994)
28. Cowley JM: Coherent convergent beam electron microdiffraction. Soviet Physics-Crystallogr 26: 533-549 (1981)
29. Cowley JM, Osman MA, Humble P: Nanodiffraction from platelet defects in diamond. Ultramicroscopy 15: 311-318 (1984)
30. Humble P: The structure and mechanism of formation of platelets in natural type Ia diamond. Proc Roy Soc (London) A381: 65-81 (1982)
31. Cowley JM: Coherent interference in convergent beam electron diffraction and shadow imaging. Ultramicroscopy 4: 435-450 (1979)
32. Lin JA, Cowley JM: Calibration of the operating parameters for an HB5 STEM instrument. Ultramicroscopy 19: 31-42 (1986)
33. Gabor D: Microscopy by reconstructed wavefronts. Proc Roy Soc (London) A197: 454-487 (1949)
34. Lin JA, Cowley JM: Reconstruction form in-line holograms by digital processing. Ultramicroscopy 19: 179-190 (1986)
35. Wang S-Y, Cowley JM: Shadow images for in-line holography in a STEM instrument. Micros Res Tech 30: 181-192 (1995)
36. Gribelyuk MA, Cowley JM: Computer analysis of side-band holography in STEM. Ultramicroscopy 45: 103-113 (1992)
37. Lichte H: Electron image plane off-axis holography of atomic structures. Adv Optical Electron Micros 12: 25-91 (1991)
38. Mankos M, Scheinfein MR, Cowley JM: Absolute magnetometry at nm transverse spatial resolution: STEM holography of thin cobalt films. J Appl Phys 75: 7418-7422 (1994)
39. Tonomura A: Applications of electron holography. Rev Mod Phys 59: 639-669 (1987)
40. Cowley JM, Mankos M, Scheinfein MR: Greatly defocussed. point-projection, off-axis electron holography. Ultramicroscopy. In press (1996)
41. Rodenburg JM: The phase problem, microdiffraction and wavelength-limited resolution - A discussion. Ultramicroscopy 27: 413-422 (1989)
42. Konnert J, D'Antonio P, Cowley JM, Higgs A, Ou H-J: Determination of atomic positions using electron nanodiffraction patterns from overlapping regions: Si [110]. Ultramicroscopy 30: 371-384 (1989)
43. Rodenburg JM, Bates RHT: The theory of super-resolution electron microscopy via Wigner distribution deconvolution. Phil Trans Roy Soc (London) A339: 521-553 (1992)
44. Rodenburg JM, McCallum BC, Nellist PD: Experimental tests on double-resolution coherent imaging via STEM. Ultramicroscopy 48: 304-314 (1993)
45. Cowley JM, Packard SD: Coherent nanodiffraction from phase objects: Carbon nanotubes. Ultramicroscopy. In press (1996)