Exploiting electron spectroscopies to probe the structure and organization of self-assembled monolayers: A review

Journal of Electron Spectroscopy and Related Phenomena

Volumn 134, Issue 2-3, 2004, Pages 97-138

  Duwez, Anne Sophie ^a  

^a UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

Author keywords

HREELS; Radiation induced damage; Self assembled monolayers; Thiols; UPS; XPS

Indexed keywords

CHEMICAL BONDS; CRYSTALLINE MATERIALS; DENSITY (SPECIFIC GRAVITY); ELECTRON BEAMS; GOLD; GROWTH (MATERIALS); MOLECULAR ORIENTATION; MOLECULAR STRUCTURE; MONOLAYERS; RADIATION DAMAGE; SELF ASSEMBLY; SURFACE PHENOMENA; SYNCHROTRON RADIATION; VAN DER WAALS FORCES;

RADIATION-INDUCED DAMAGE; SURFACE SENSITIVE TECHNIQUES;

ELECTRON SPECTROSCOPY;

EID: 0842333969     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2003.10.005     Document Type: Review

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