Tip-induced structural rearrangements of alkanethiolate self-assembled monolayers on gold

Journal of Physical Chemistry B

Volumn 101, Issue 27, 1997, Pages 5263-5276

  Touzov, Igor ^a   Gorman, Christopher B ^a  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; CONFORMATIONS; CRYSTAL ORIENTATION; CRYSTAL SYMMETRY; FRICTION; GOLD; MONOLAYERS; SCANNING TUNNELING MICROSCOPY; SULFUR COMPOUNDS;

ALKANETHIOLATE; FRICTION FORCE MODE (FFM);

SUPERLATTICES;

EID: 0031551267     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp9638999     Document Type: Article

References (66)

1. Whitesides, G. M.; Gorman, C. B. In Handbook of Surface Imaging and Visualization; Hubbard, A. T.; Ed.; CRC Press: Boca Raton, FL, 1995; pp 713-733.
2. Ulman, A. An Introduction to Ultrathin Organic Films; Academic Press: San Diego, CA, 1991.
3. Lercel, M. J.; Craighead, H. G.; Parikh, A. N.; Seshadri, K.; Allara, D. L. Appl. Phys. Lett. 1996, 68, 1504-1506.
4. Xu, L. S.; Allee, D. R. J. Vac. Sci. Technol. B 1995, 13, 2837-2840.
5. Müller, H. U.; David, C.; Völkel, B.; Grunze, M. J. Vac. Sci. Technol. B 1995, 13, 2846-2849.
6. Sondag-Huethorst, J. A. M.; Helleputte, H. R. J. v.; Fokkink, L. G. J. Appl. Phys. Lett. 1994, 64, 285-287.
7. Takami, T.; Delamarche, E.; Michel, B.; Gerber, C.; Wolf, H.; Ringsdorf, H. Langmuir 1995, 11, 3876-3881.
8. Bumm, L. A.; Arnold, J. J.; Cygan, M. T.; Dunbar, T. D.; Burgin, T. P.; Jones, L., II; Allara, D. L.; Tour, J. M.; Weiss, P. S. Science 1996, 271, 1705-1707.
9. Poirier, G. E.; Tarlov, M. J.; Rushmeier, H. E. Langmuir 1994, 10, 3383-3386.
10. Poirier, G. E.; Tarlov, M. J. J. Phys. Chem. 1995, 99, 10966-10970.
11. Poirier, G. E.; Pylant, E. D. Science 1996, 272, 1145-1148.
12. Kang, J.; Rowntree, P. A. Langmuir 1996, 12, 2813-2819.
13. Camillone, N., III; Leung, T. Y. B.; Schwartz, P.; Eisenberger, P.; Scoles, G. Langmuir 1996, 12, 2737-2746.
14. Delamarche, E.; Michel, B.; Gerber, C.; Anselmetti, D.; Güntherodt, H.-J.; Wolf, H.; Ringsdorf, H. Langmuir 1994, 10, 2869-2871.
15. Delamarche, E.; Michel, B.: Kang, H.; Gerber, C. Langmuir 1994, 10, 4103-4108.
16. Delamarche, E.; Michel, B. Thin Solid Films 1996, 273, 54-60.
17. Delamarche, E.; Micnel, B.; Biebuyck, H. A.; Gerber, C. Adv. Mater. 1996, 8, 719-729.
18. Larsen, N. B.; Biebuyck, H.; Delamarche, E.; Michel, B. J. Am. Chem. Soc. 1997, 119, 3017-3026.
19. Sprik, M.; Delamarche, E.; Michel, B.; Röthlisberger, U.; Klein, M. L.; Wolf, H.; Ringsdorf, H. Langmuir 1994, 10, 4116-4130.
20. Caldwell, W. B.; Campbell, D. J.; Chen, K.; Herr, B. R.; Mirkin, C. A.; Malik, A.; Durbin, M. K.; Dutta, P.; Huang, K. G. J. Am. Chem. Soc. 1995, 117, 6071-6082.
21. Sondag-Huethorst, J. A. M.; Schönenberger, C.; Fokkink, L. G. J. J. Phys. Chem. 1994, 98, 6826-6834.
22. Schönenberger, C.; Sondag-Huethorst, J. A. M.; Jorritsma, J.; Fokkink, L. G. J. Langmuir 1994, 10, 611-614.
23. Schönenberger, C.; Jorritsma, J.; Sondag-Huethorst, J. A. M.; Fokkink, L. G. J. J. Phys. Chem. 1995, 99, 3259-3271.
24. Poirier, G. E.; Tarlov, M. J. Langmuir 1994, 10, 2853-2856.
25. Camillone, N., III; Eisenberger, P.; Leung, T. Y. B.; Schwartz, P.; Scoles, G.; Poirier, G. E.; Tarlov, M. J. J. Chem. Phys. 1994, 101, 11031-11036.
26. Jaschke, M.; Schönherr, H.; Wolf, H.; Butt. H.-J.; Bamberg, E.; Besocke, M. K.; Ringsdorff, H. J. Phys. Chem. 1996, 100, 2290-2301.
27. Alves, C. A.; Smith, E. L.; Porter, M. D. J. Am. Chem. Soc. 1992, 114, 1222-1227.
28. McDermott, C. A., McDermott, M. T.; Green, J.-B.; Porter, M. D. J. Phys. Chem. 1995, 99, 13257-13267.
29. Nuzzo, R. G.; Fusco, F. A.; Allara, D. L. J. Am. Chem. Soc. 1987, 109, 2358-2368.
30. Camillone, N., III; Chidsey, C. E. D.; Liu, G. Y.; Scoles, G. J. Chem. Phys. 1993, 98, 3503-3511.
31. Camillone, N., III; Chidsey, C. E. D.; Eisenberger, P.; Fenter, P.; Li, J.; Liang, K. S.; Liu, G. Y.; Scoles, G. J. Chem. Phys. 1993, 99, 744-747.
32. Pertsin, A. J.; Grunze, M. Langmuir 1994, 10, 3668-3674.
33. Zubrägel, C.; Deuper, C.; Schneider, F.; Neumann, M.; Grunze, M.; Schertel, A.; Wöll, C. Chem. Phys. Lett. 1995, 238, 308-312.
34. This procedure has been successful in generating clean silver surfaces: Parker, J. L.; Christenson, H. K. J. Chem. Phys. 1988, 88, 8013-8014.
35. Hegner, M.; Wagner, P.; Semenza, G. Surf. Sci. 1993, 291, 39-46.
36. Wagner, P.; Hegner, M.; Guntherodt, H.-J.; Semenza, G. Langmuir 1995, 11, 3867-3875.
37. Chailapakul, O.; Sun, L.; Xu, C.; Crooks, R. M. J. Am. Chem. Soc. 1993, 115, 12459-12467.
38. Although the images of the transformations induced here do establish defined periodic structures, this method of imaging, where the tip is used to change the surface and also to probe its structure, is not ideal. As the surface is influenced by its interaction with the tip, so is the tip influenced by its interaction with the surface. Nose, apparent drift, and other features which, although they do not completely obfuscate the surface structure, do reduce the quality of the image are likely caused partially by surface-induced changes in the tip geometry.
39. Magonov, S. N.; Whangbo, M.-H. Surface Analysis with STM and AFM; VCH Publishers: New York, 1996.
40. We make this claim with the caveat that any image obtained by any scanning microscopy technique will strictly have a maximum symmetry of p2 because any noise or tip-sample artifact (which will be observed in the direction of scanning) will result in observed features whose symmetry is broken by the scanning direction. Even looking at a hexagonal lattice like graphite, it is only possible to say that the lattice has p6m symmetry by assuming that any features due to the scanning process are ignored. With this assumption this lattice has at least p31m plane symmetry.
41. At higher set-point forces, the thiol can be removed from the surface by the tip: Liu, G.-Y.; Salmeron, M. B. Langmuir 1994, 10, 367-370.
42. Weisenhorn, A. L.; Khorsandi, M.; Kasas, S.; Gotzos, V.; Butt, H.-J. Nanotechnology 1993, 4, 106-113.
43. Weihs, T. P.; Nawaz Z.; Jarvis, S. P.; Pethica, J. B. Appl. Phys. Lett. 1991, 59, 3536-3538.
44. Lide, D. R.; Kehiaian, H. V. CRC handbook of Thermophysical and Thermochemical Data; CRC Press: Boca Raton, FL, 1994.
45. Bengel, H.; Cantow, H.-J.; Maganov, S. N.; Monconduit, L.; Evain, M.; Whangbo, M.-H. Surf. Sci. 1994, 321, L170-L176.
46. Bengel, H.; Cantow, H.-J.; Magonov, S. N.; Hillebrecht, H.; Thiele, G.; Liang, W.; Whangbo, M.-H. Surf. Sci. 1995, 95-1033.
47. Bengel, H.; Cantow, H.-J.; Evain, M.; Magonov, S. N.; Whangbo, M.-H. Surf. Sci. 1996, 365, 461-472.
48. Mate, C. M.; Erlandsson, R.; McClelland, G. M.; Chiang, S. Surf. Sci. 1989, 208, 473-486.
49. Salmeron, M.; Ogletree, D. F.; Ocal, C.; Wang, H.-C.; Neubauer, G.; Kolbe, W.; Meyers, G. J. Vac. Sci. Technol. B 1991, 9, 1347-1352.
50. Mamin, H. J.; Ganz, E.; Abraham, D. W.; Thomson, R. E.; Clarke, J. Phys. Rev. B 1986, 34, 9015-9018.
51. Dürig, U.; Züger, O.; Michel, B.; Häussling, L.; Ringsdorf, H. Phys. Rev. B 1993, 48, 1711-1717.
52. Frisbie, C. D.; Rozsnyai, L. F.; Noy, A.; Wrighton, M. S.; Lieber, C. M. Science 1994, 265, 2071-2074.
53. Noy, A.; Frisbie, C. D.; Rozsnyai, L. F.; Wrighton, M. S.; Lieber, C. M. J. Am. Chem. Soc. 1995, 117, 7943-7951.
54. Wilbur, J. L.; Biebuyck, H. A.; Macdonald, J. C.; Whitesides, G. M. Langmuir 1995, 11, 825-831.
55. Green, J. B. D.; Mcdermott, M. T.; Porter, M. D.; Siperko, L. M. J. Phys. Chem. 1995, 99, 10960-10965.
56. Han, T.; Williams, J. M.; Beebe, T. P. Anal. Chim. Acta 1995, 307, 365-376.
57. Santesson, L.; Wong, T. M. H.; Taborelli, M.; Descouts, P.; Liley, M. J. Phys. Chem. 1995, 99, 1038-1045.
58. Bai, C. L.; Zhang, P. C.; Zhu, D. B.; Han, M. Y.; Xu, Y. J. Phys. Chem. 1995, 99, 8202-8205.
59. Fujiwara, I.; Kamei, T.; Seto, J. Jpn. J. Appl. Phys. Pt. 1 1995, 34, 4932-4939.
60. Liu, Y. H.; Evans, D. F.; Song, Q.; Grainger, D. W. Langmuir 1996, 12, 1235-1244.
61. Meyer, E.; Overney, R.; Luthi, R.; Brodbeck, D.; Howald, L. Thin Solid Films 1992, 220, 132-137.
62. Overney, R. M.; Meyer, E.; Frommer, J.; Guntherodt, H. J.; Fujihira, M. Langmuir 1994, 10, 1281-1286.
63. Fujihira, M.; Takano, H. Thin Solid Films 1994, 243, 446-449.
64. Yang, X. M.; Xiao, D.; Xiao, S. J.; Wei, Y. Appl. Phys. A 1994, 59, 139-143.
65. Yuba, T.; Yokoyama, S.; Kakimoto, M.; Imai, K. Y. Adv. Mater. 1994, 6, 888-889.
66. Venkataraman, B.; Flynn, G. W.; Wilbur, J. L.; Folkers, J. P.; Whitesides, G. M. J. Phys. Chem. 1995, 99, 8684-8689.