High-resolution lateral differentiation using a macroscopic probe: XPS of organic monolayers on composite Au-SiO2 surfaces

Journal of the American Chemical Society

Volumn 122, Issue 20, 2000, Pages 4959-4962

  Shabtai, Keren ^a   Rubinstein, Israel ^a   Cohen, Sidney R ^a   Cohen, Hagai ^a  

^a WEIZMANN INSTITUTE OF SCIENCE   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

GOLD; SILICON DIOXIDE;

ADSORPTION; ARTICLE; ELECTRIC CONDUCTIVITY; MOLECULAR INTERACTION; SURFACE CHARGE; SURFACE PROPERTY; X RAY SPECTROMETRY;

EID: 0034709435     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja993710h     Document Type: Article

References (30)

1. Seah, M. P. In Practical Surface Analysis, 2nd ed.; Briggs, D., Seah, M. P., Eds.; Wiley: New York, 1990; Vol. 1, App. 2, p541 and references therein.
2. Beamson, G.; Briggs, D. High-Resolution XPS of Organic Polymers; Wiley: New York, 1992.
3. Ogama, T. J. Vac. Sci. Technol. 1996, A14, 1309.
4. Larson, P. E.; Kelly, M. A. J. Vac. Sci. Technol. 1998, A16, 3483.
5. Barr, T. L. In Practical Surface Analysis, 2nd ed.; Briggs, D., Seah, M. P., Eds.; Wiley: New York, 1990; Vol. 1, p 357.
6. Tielsch, B. J.; Fulghum, J. E. Surf. Interface Anal. 1996, 24, 422.
7. Lewis, R. T.; Kelley, M. A. J. Electron Spectrosc. Relat. Phenom. 1980, 20, 105.
8. Tielsch, B. J.; Fulghum, J. E.; Surman, D. J. Surf. Interface Anal. 1996, 24, 459.
9. Tielsch, B. J.; Fulghum, J. E. Surf. Interface Anal. 1997, 25, 904.
10. Bandis, C.; Pate, B. B. Surf. Sci. 1996, 345, L23.
11. Barr, T. L. J. Vac. Sci. Technol. 1989, A7, 1677.
12. Cazaux, J.; Leheude, P. J. Electron Spectrosc. Relat. Phenom. 1992, 59, 49.
13. Miller, J. D.; Harris, W. C.; Zajac, G. W. Surf. Interface Anal. 1993, 20, 977.
14. Beamson, G.; Clark, D.; Deegan, D. E.; Hayes, N. W.; Law, D. S-L.; Rasmusson, J. R.; Salaneck, W. R. Surf. Interface Anal. 1996, 24, 204.
15. Clark, D. T.; Dilks, A.; Thomas, H. R.; Shuttleworth, D. J. Polym. Sci. Polym. Chem. Ed. 1979, 17, 627.
16. Beamson, G.; Bunn, A.; Briggs, D. Surf. Interface Anal. 1991, 17, 105.
17. Hiraki, A. Surf. Sci. 1986, 168, 74.
18. Cros, A.; Dallaporta, H.; Oberlin, J. C. Appl. Surf. Sci. 1992, 56-58, 434.
19. Shabtai, K.; Cohen, S. R.; Cohen, H.; Rubinstein, I., in preparation.
20. When the Au is evaporated on oxide-covered Si, the tendency of Si atoms to diffuse through the Au film is effectively suppressed.
21. Ron, H.; Matlis, S.; Rubinstein, I. Langmair 1998, 14, 1116.
22. Frydman, E.; Cohen, H.; Maoz, R.; Sagiv, J. Langmuir 1997, 13, 5089.
23. The diameter was measured over individual grains after erosion of the tip shape, obtained from the image by blind reconstruction (software developed by A. Efimov, available as freeware at http://www. siliconmdt.com). This procedure gives an upper bound for the true feature size, and yielded diameters 20-40 nm smaller than those measured on the raw image.
24. Several blank experiments were carried out: (i) The spectral shifts obtained with blank samples (i.e., before monolayer self-assembly) are in good agreement with the results in Table 1. (ii) Electrical isolation of the sample holder almost completely removes the differential effects.
25. The curve fittings for the gun-off measurements are, therefore, less determining than the gun-on ones.
26. 19
27. Details on the data analysis and models used are given as Supporting Information.
28. n=0[exp(-nδ/λ)] = [1 - exp(-9δ/λ)]/[1 - exp(-δ/λ)] where δ is the projection of the interatomic (C-C) distance along the vertical axis.
29. lm is related to grain edges, namely, to silica regions relatively close to the gold, is ruled out due to lack of a corresponding feature in the O line shape).
30. Doron-Mor, I.; Hatzor, A.; Vaskevich, A.; Shanzer, A.; Rubinstein, I.; Cohen, H., manuscript submitted.