Characterization of X-ray induced damage in alkanethiolate monolayers by high-resolution photoelectron spectroscopy

Langmuir

Volumn 17, Issue 1, 2001, Pages 8-11

  Heister, K ^a   Zharnikov, M ^a   Grunze, M ^a   Johansson, L S O ^b   Ulman, A ^c  

^a UNIVERSITY OF HEIDELBERG   (Germany)

^b KARLSTAD UNIVERSITY   (Sweden)

^c POLYTECHNIC UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONS; IRRADIATION; PHOTOELECTRON SPECTROSCOPY; SULFUR; SYNCHROTRONS; X RAY ANALYSIS;

SELF-ASSEMBLED MONOLAYERS;

MONOLAYERS;

EID: 0035128088     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la001101d     Document Type: Article

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