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Volumn 88-91, Issue , 1998, Pages 821-830

Photoemission studies of functional organic materials and their interfaces

Author keywords

ARUPS; Electroluminescent device; Energy band dispersion; Interface; Molecular orientation

Indexed keywords

APPROXIMATION THEORY; CHARGE TRANSFER; ELECTRONIC STRUCTURE; INTERFACES (MATERIALS); LUMINESCENT DEVICES; MATHEMATICAL MODELS; MOLECULAR ORIENTATION; MOLECULAR STRUCTURE; ORGANIC COMPOUNDS; OXYGEN; PHOTOEMISSION; POLARIZATION;

EID: 15944362848     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0368-2048(97)00168-0     Document Type: Article
Times cited : (31)

References (50)
  • 1
    • 0038840851 scopus 로고
    • Springer, Berlin
    • For reviews and fundamental aspects, e.g. W.D. Grobman, E.E. Koch, Photoemission in Solids, vol. 2, Springer, Berlin, 1979, p. 261; W.R. Salaneck, CRC Crit. Rev. Solid State Mater. Sci., 12 (1985) 267; K. Seki, Optical Techniques to Characterize Polymer Systems, Elsevier, Amsterdam, 1989, p. 115.
    • (1979) Photoemission in Solids , vol.2 , pp. 261
    • Grobman, W.D.1    Koch, E.E.2
  • 2
    • 84948882261 scopus 로고
    • For reviews and fundamental aspects, e.g. W.D. Grobman, E.E. Koch, Photoemission in Solids, vol. 2, Springer, Berlin, 1979, p. 261; W.R. Salaneck, CRC Crit. Rev. Solid State Mater. Sci., 12 (1985) 267; K. Seki, Optical Techniques to Characterize Polymer Systems, Elsevier, Amsterdam, 1989, p. 115.
    • (1985) CRC Crit. Rev. Solid State Mater. Sci. , vol.12 , pp. 267
    • Salaneck, W.R.1
  • 3
    • 0005368005 scopus 로고
    • Elsevier, Amsterdam
    • For reviews and fundamental aspects, e.g. W.D. Grobman, E.E. Koch, Photoemission in Solids, vol. 2, Springer, Berlin, 1979, p. 261; W.R. Salaneck, CRC Crit. Rev. Solid State Mater. Sci., 12 (1985) 267; K. Seki, Optical Techniques to Characterize Polymer Systems, Elsevier, Amsterdam, 1989, p. 115.
    • (1989) Optical Techniques to Characterize Polymer Systems , pp. 115
    • Seki, K.1
  • 14
    • 0039270258 scopus 로고    scopus 로고
    • and references therein
    • N. Ueno, J. Electron Spectrosc. 78 (1996) 345 and references therein.
    • (1996) J. Electron Spectrosc. , vol.78 , pp. 345
    • Ueno, N.1
  • 32
    • 0003752338 scopus 로고
    • Cambridge University Press, Cambridge, and references therein
    • A. Zangwill, Physics at Surfaces, Cambridge University Press, Cambridge, 1988, and references therein.
    • (1988) Physics at Surfaces
    • Zangwill, A.1
  • 34
  • 36
    • 0041853825 scopus 로고
    • C.R. Brundle, A.D. Baker (Eds.), Academic Press, New York, Ch. 3
    • N.V. Richardson, A.M. Bradshaw, in: C.R. Brundle, A.D. Baker (Eds.), Electron Spectroscopy, Vol. 4, Academic Press, New York, 1982, Ch. 3.
    • (1982) Electron Spectroscopy , vol.4
    • Richardson, N.V.1    Bradshaw, A.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.