Determination of thickness of a self-assembled monolayer of dodecanethiol on Au(111) by angle-resolved X-ray photoelectron spectroscopy

Langmuir

Volumn 14, Issue 19, 1998, Pages 5656-5658

  Kondo, Toshihiro ^a   Yanagida, Masatoshi ^a   Shimazu, Katsuaki ^a   Uosaki, Kohei ^a  

^a HOKKAIDO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; ALCOHOLS; DESORPTION; ELECTROCHEMISTRY; GOLD; MOLECULAR STRUCTURE; PARAFFINS; SULFUR COMPOUNDS; THICKNESS MEASUREMENT; X RAY PHOTOELECTRON SPECTROSCOPY;

ANGLE-RESOLVED X-RAY PHOTOELECTRON SPECTROSCOPY (ARXPS); DODECANETHIOLS; SELF-ASSEMBLED MONOLAYERS (SAM);

MONOLAYERS;

EID: 0032162369     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la980517c     Document Type: Article

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