X-ray and low energy electron induced damage in alkanethiolate monolayers on Au-substrates

Zeitschrift fur Physikalische Chemie

Volumn 202, Issue 1-2, 1997, Pages 263-272

  Jager B ^a   Schurmann H ^b   Muller H U ^a   Himmel, H J ^a   Neumann, M ^b   Grunze, M ^a   Woll Ch ^a  

^a UNIVERSITY OF HEIDELBERG   (Germany)

^b UNIVERSITY OF OSNABRÜCK   (Germany)

Author keywords

Alkanethiolates; E beam damage; NEXAFS; Self assembled monolayers; X ray exposure

Indexed keywords

ELECTRONS; GOLD DEPOSITS; HYDROCARBONS; PHOTOELECTRON SPECTROSCOPY; SECONDARY EMISSION; SELF ASSEMBLED MONOLAYERS; SULFUR COMPOUNDS; X RAY ABSORPTION SPECTROSCOPY; X RAYS;

ALKANETHIOLATES; E-BEAMS; GRAZING-INCIDENCE X-RAY DIFFRACTION; NEXAFS; PHOTOEMISSION PROCESS; SOFT X-RAY ABSORPTION SPECTROSCOPIES; X-RAY EXPOSURE; X-RAY INDUCED DAMAGE;

MONOLAYERS;

EID: 4243272229     PISSN: 09429352     EISSN: None     Source Type: Journal    
DOI: 10.1524/zpch.1997.202.part_1_2.263     Document Type: Article

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