Controlled surface charging as a depth-profiling probe for mesoscopic layers

Nature

Volumn 406, Issue 6794, 2000, Pages 382-385

  Doron Mor, Ilanit ^a   Hatzor, Anat ^a   Vaskevich, Alexander ^a   Van Der Boom Moav, Tamar ^a   Shanzer, Abraham ^a   Rubinstein, Israel ^a   Cohen, Hagal ^a  

^a WEIZMANN INSTITUTE OF SCIENCE   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTIC METHOD; ARTICLE; ENERGY TRANSFER; PRIORITY JOURNAL; ROENTGEN SPECTROSCOPY; SURFACE PROPERTY;

EID: 0034721147     PISSN: 00280836     EISSN: None     Source Type: Journal    
DOI: 10.1038/35019025     Document Type: Article

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