Reactivity of self-assembled monolayers: Formation of organized amino functionalities

Physical Chemistry Chemical Physics

Volumn 2, Issue 7, 2000, Pages 1509-1514

  Dannenberger, Oliver ^a   Weiss, Klaus ^b   Wöll, Christof ^b   Buck, Manfred ^a  

^a UNIVERSITY OF HEIDELBERG   (Germany)

^b RUHR UNIVERSITY BOCHUM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AMINE; BEHENYL ALCOHOL; GOLD; SILANE DERIVATIVE; SULFONIC ACID DERIVATIVE; THIOL DERIVATIVE; TOLUENESULFONAMIDE DERIVATIVE;

ARTICLE; CHEMICAL REACTION; CHEMICAL STRUCTURE; CONFORMATION; REACTION ANALYSIS; ROENTGEN SPECTROSCOPY; SURFACE PROPERTY;

EID: 0034177091     PISSN: 14639076     EISSN: None     Source Type: Journal    
DOI: 10.1039/a909589f     Document Type: Article

References (40)

1. 1 R. G. Nuzzo and D. L. Allara, J. Am. Chem. Soc., 1983, 15, 4481.
2. 2 C. D. Bain, E. B. Troughton, Y. Tao, J. Evall, G. M. Whitesides and R. G. Nuzzo, J. Am. Chem. Soc., 1989, 111, 321.
3. 3 A. Ulman, An Introduction to Ultrathin Organic Films, Academic Press, San Diego, 1991.
4. 4 L. H. Dubois and R. G. Nuzzo, Annu. Rev. Phys. Chem., 1992, 43, 437.
5. 5 A. Ulman, Chem. Rev., 1996, 96, 1533.
6. 6 H. O. Finklea, in Electroanalytical Chemistry, Vol. 19, Marcel Dekker, New York, 1996, pp. 105-335.
7. 7 T. Wink, A. van Zuilen, A. Bult and W. P. van Bennekom, Analyst, 1997, 122, R43.
8. 8 P. E. Laibinis, R. G. Nuzzo and G. M. Whitesides, J. Phys. Chem., 1992, 96, 5097.
9. 9 S. A. Joyce, R. C. Thomas, J. E. Houston, T. A. Michalske and R. M. Crooks, Phys. Rev. Lett., 1992, 68, 2790.
10. 10 E. U. Thoden van Velzen, J. F. J. Engbersen, P. J. de Lange, J. W. G. Mahy and D. N. Reinhoudt, J. Am. Chem. Soc., 1995, 117, 6853.
11. 11 O. Chailapakul, L. Sun, C. Xu and R. M. Crooks, J. Am. Chem. Soc., 1993, 115, 12459.
12. 12 C. Erdelen, L. Häussling, R. Naumann, H. Ringsdorf, H. Wolf, J. Yang, M. Liley, J. Spinke and W. Knoll, Langmuir, 1994, 10, 1246.
13. 13 P. E. Laibinis and G. M. Whitesides, J. Am. Chem. Soc., 1992, 114, 9022.
14. 14 O. Dannenberger, K. Weiss, H. Himmel, B. Jäger, M. Buck and Ch. Wöll, Thin Solid Films, 1997, 307, 183.
15. 15 L. Sun, R. C. Thomas, R. M. Crooks and A. J. Ricco, J. Am. Chem. Soc., 1991, 113, 8550.
16. 16 R. V. Duevel and R. M. Corn, Anal. Chem., 1992, 64, 337.
17. 17 H. Himmel, K. Weiss, B. Jäger, O. Dannenberger, M. Grunze and Ch. Wöll, Langmuir, 1997, 13, 4943.
18. 18 L. Yan, C. Marzolin, A. Terfort and G. M. Whitesides, Langmuir, 1997, 13, 6704.
19. 19 V. Chechnik and C. J. M. Stirling, Langmuir, 1998, 14, 99.
20. 20 S. Pan, D. G. Castner and B. Ratner, Langmuir, 1998, 14, 3545.
21. 21 For an interesting alternative for changing surface functionalities via the release of attached groups see : C. D. Hodneland and M. Mrksich, Langmuir, 1997, 13, 6001.
22. 22 H. Beyer and W. Walter, Lehrbuch der organischen Chemie, S. Hirzel Verlag, Stuttgart, 1988.
23. 23 O. Dannenberger, Diploma Thesis, University of Heidelberg, 1993.
24. 24 A. Wesch, O. Dannenberger, Ch. Wöll, J. J. Wolff and M. Buck, Langmuir, 1996, 12, 5330.
25. 25 C. D. Bain and G. M. Whitesides, J. Phys. Chem., 1989, 93, 1670.
26. 26 H. S. Hansen, S. Tougaard and H. Biebuyck, J. Electron Spectrosc. Relat. Phenom., 1992, 58, 141.
27. 27 J. Stöhr, NEXAFS Spectroscopy, Springer Series in Surface Sciences, Springer Verlag, Berlin, 1992.
28. 28 M. Kinzler, A. Schertel, G. Hähner, Ch. Wöll, M. Grunze, A. Albrecht, G. Holzhüter and T. Gerber, J. Chem. Phys., 1994, 100, 7722.
29. 29 J. B. Schlenoff, M. Li and H. Ly, J. Am. Chem. Soc., 1995, 117, 12528.
30. 30 For a recent publication on the electrochemical stability of SAMs see: M. W. J. Beulen, M. I. Kastenberg, F. C. J. M. van Veggel and D. N. Reinhoudt, Langmuir, 1998, 14, 7463.
31. 31 J. Sagiv, J. Am. Chem. Soc., 1980, 102, 92.
32. 32 K. Bierbaum, M. Kinzler, Ch. Wöll, M. Grunze, G. Hähner, S. Heid and F. Effenberger, Langmuir, 1995, 11, 512.
33. 33 P. S. Bagus, K. Weiss, A. Schertel, Ch. Wöll, W. Braun, C. Hellwig and C. Jung, Chem. Phys. Lett., 1996, 248, 129.
34. 34 K. Holldack, M. Grunze, M. Kinzler, H. Kerkow and C. R. Brundle, J. Electron Spectrosc. Relat. Phenom., 1995, 73, 239.
35. 35 B. Jäger, H. Schürmann, H. U. Müller, H. Himmel, M. Neumann, M. Grunze and Ch. Wöll, Z. Phys. Chem., 1997, 202, 263.
36. 36 G. Hähner, M. Kinzler, C. Thümmler, Ch. Wöll and M. Grunze, J. Vac. Sci. Technol. A, 1992, 10, 2758.
37. 37 R. G. Nuzzo, E. M. Korenic and L. H. Dubois, J. Chem. Phys., 1990, 93, 767.
38. 38 K. Weiss, S. Gebert, M. Wühn, H. Wadepohl and Ch. Wöll, J. Vac. Sci. Technol. A, 1998, 16, 1017.
39. 39 D. Wacker, D. Weiss, U. Kazmaier and Ch. Wöll, Langmuir, 1997, 13, 6689.
40. 40 J. H. Scofield, J. Electron. Spectrosc. Relat. Phenom., 1976, 8, 129.