Design and CAD Challenges in sub-90nm CMOS Technologies

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers

Volumn , Issue , 2003, Pages 129-136

  Bernstein, Kerry ^a   Chuang, Ching Te ^a   Joshi, Rajiv ^a   Puri, Ruchir ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; COMPUTER AIDED DESIGN; DIGITAL DEVICES; ELECTRON TUNNELING; GATES (TRANSISTOR); HEAT RESISTANCE; IMPACT IONIZATION; LEAKAGE CURRENTS; MICROELECTROMECHANICAL DEVICES; MOSFET DEVICES; SILICON COMPOUNDS; SILICON ON INSULATOR TECHNOLOGY; THERMOCOUPLES;

MOLECULAR COMPUTING; SELF-HEATING;

CMOS INTEGRATED CIRCUITS;

EID: 0346148452     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/iccad.2003.159681     Document Type: Conference Paper

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