Self-heating enhanced impact ionization in SOI MOSFETs

IEEE International SOI Conference

Volumn , Issue , 2001, Pages 31-32

  Su, P ^a   Goto, K ^a   Sugii, T ^a   Hu, C ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GATES (TRANSISTOR); HIGH TEMPERATURE EFFECTS; LOGIC DEVICES; MOSFET DEVICES; SEMICONDUCTING SILICON; SILICON ON INSULATOR TECHNOLOGY;

SELF-HEATING;

IMPACT IONIZATION;

EID: 0035159829     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)