Atomic force microscopy with nanoelectrode tips for high resolution electrochemical, nanoadhesion and nanoelectrical imaging

Nanotechnology

Volumn 28, Issue 9, 2017, Pages

  Nellist, Michael R ^a   Chen, Yikai ^b   Mark, Andreas ^c   Gödrich, Sebastian ^c   Stelling, Christian ^c   Jiang, Jingjing ^b   Poddar, Rakesh ^d   Li, Chunzeng ^d   Kumar, Ravi ^e   Papastavrou, Georg ^c   Retsch, Markus ^c   Brunschwig, Bruce S ^f   Huang, Zhuangqun ^d,g   Xiang, Chengxiang ^g   Boettcher, Shannon W ^a  

^a UNIVERSITY OF OREGON   (United States)

^b California Institute of Technology   (United States)

^c UNIVERSITY OF BAYREUTH   (Germany)

^d Bruker Corporation   (United States)

^e Brown University   (United States)

^f CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^g California Institute of Technology   (United States)

Author keywords

atomic force microscopy; multi modal nanoimaging; nanoscale scanning electrochemical microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; COATED MATERIALS; DIELECTRIC MATERIALS; ELECTROCHEMICAL ELECTRODES; GRAPHITE; GRAPHITE ELECTRODES; PROBES; SCANNING ELECTRON MICROSCOPY; SURFACE DEFECTS; SURFACE TOPOGRAPHY;

ELECTRICAL CONDUCTIVITY; ELECTROCHEMICAL ACTIVITIES; ELECTROCHEMICAL APPLICATIONS; ELECTROCHEMICAL ENVIRONMENTS; ELECTROCHEMICAL IMAGING; HIGHLY ORIENTED PYROLYTIC GRAPHITE ELECTRODES; NANO-IMAGING; SCANNING ELECTROCHEMICAL MICROSCOPY;

ANALYTIC EQUIPMENT;

EID: 85011977324     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/1361-6528/aa5839     Document Type: Article

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