SCOPUS 정보 검색 플랫폼

Advanced Energy Materials

Volumn 6, Issue 12, 2016, Pages

In Situ Measurement of Solid Electrolyte Interphase Evolution on Silicon Anodes Using Atomic Force Microscopy

(5) Yoon, Insun a Abraham, Daniel P b Lucht, Brett L c Bower, Allan F a Guduru, Pradeep R a

a Brown University (United States)

b ARGONNE NATIONAL LABORATORY (United States)

c University of Rhode Island (United States)

Author keywords

atomic force microscopy; hysteresis; silicon anodes; solid electrolyte interphase; thickness evolution

Indexed keywords

AMORPHOUS FILMS; ANODES; ATOMIC FORCE MICROSCOPY; ELECTROCHEMICAL ELECTRODES; ETHYLENE; FILM THICKNESS; HYSTERESIS; LITHIUM COMPOUNDS; SEEBECK EFFECT; SOLID ELECTROLYTES; THICKNESS MEASUREMENT;

ELECTROLYTE COMPOSITIONS; EQUILIBRIUM POTENTIALS; LITHIATION/DELITHIATION; PROPYLENE CARBONATE; SILICON ANODE; SOLID ELECTROLYTE INTERPHASE; SOLID ELECTROLYTE INTERPHASE LAYER (SEI); THICKNESS EVOLUTION;

AMORPHOUS SILICON;

EID: 84979723367 PISSN: 16146832 EISSN: 16146840 Source Type: Journal
DOI: 10.1002/aenm.201600099 Document Type: Article

Times cited : (87)

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