Electrochemical atomic force microscopy using a tip-attached redox mediator for topographic and functional imaging of nanosystems

ACS Nano

Volumn 3, Issue 10, 2009, Pages 2927-2940

  Anne, Agnes ^a   Cambril, Edmond ^b   Chovin, Arnaud ^a   Demaille, Christophe ^a   Goyer, Cédric ^a  

^a UNIVERSITÉ PARIS DIDEROT   (France)

^b CNRS   (France)

Author keywords

AFM SECM; Electrochemical atomic force microscopy; Electrochemical microscopy; HOPG electrochemistry; Redox functionalized AFM tips; SECM; Tapping mode AFM SECM; Tarm AFM SECM; Tip attached redox mediator electrochemical atomic force microscopy

Indexed keywords

AFM/SECM; ELECTROCHEMICAL ATOMIC FORCE MICROSCOPY; ELECTROCHEMICAL MICROSCOPY; HOPG ELECTROCHEMISTRY; REDOX-FUNCTIONALIZED AFM TIPS; SECM; TAPPING MODE AFM/SECM; TARM/AFM-SECM; TIP-ATTACHED REDOX MEDIATOR/ELECTROCHEMICAL ATOMIC FORCE MICROSCOPY;

ATOMS; ELECTROCHEMISTRY; IRON COMPOUNDS; LEAD ACID BATTERIES; NANOPROBES; NANOSYSTEMS; POLYETHYLENE GLYCOLS; POLYETHYLENE OXIDES; PROBES; SUBSTRATES;

ATOMIC FORCE MICROSCOPY;

MACROGOL DERIVATIVE; NANOMATERIAL;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; ELECTROCHEMISTRY; MOLECULAR IMAGING; OXIDATION REDUCTION REACTION;

ELECTROCHEMISTRY; MICROSCOPY, ATOMIC FORCE; MOLECULAR IMAGING; NANOSTRUCTURES; OXIDATION-REDUCTION; POLYETHYLENE GLYCOLS;

EID: 70350649036     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn9009054     Document Type: Article

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