Combined scanning electrochemical atomic force microscopy for tapping mode imaging

Applied Physics Letters

Volumn 82, Issue 10, 2003, Pages 1592-1594

  Kueng, A ^a   Kranz, C ^a   Mizaikoff, B ^a   Lugstein, A ^b   Bertagnolli, E ^b  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^b VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTROLYTES; ION BEAMS; SILICON NITRIDE; VAPOR DEPOSITION;

MODE IMAGING;

IMAGING TECHNIQUES;

EID: 0037429873     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1559652     Document Type: Article

References (20)

1. H. Muramatsu, N. Chiba, T. Umemoto, K. Homma, K. Nakajima, T. Ataka, S. Ohta, A. Kusumi, and M. Fujihira, Ultramicroscopy 61, 265 (1995).
2. H. Muramatsu, N. Chiba, K. Hnakajima, S. Ohta, A. Kusumi, and M. Fujihira, Appl. Phys. Lett. 66, 3245 (1995).
3. J. V. Macpherson, P. R. Unwin, A. C. Hiller, and A. J. Bard, J. Am. Chem. Soc. 119, 6445 (1996).
4. M. Abraham, W. Ehrfeld, M. Lacher, K. Mayer, W. Noell, P. Guthner, and J. Barenz, Ultramicroscopy 71, 93 (1998).
5. G. Schuermann, W. Noell, U. Staufer, and N. F. de Rooij, Ultramicroscopy 82, 33 (2000).
6. J. V. Macpherson and P. R. Unwin, Anal. Chem. 72, 276 (2000).
7. J. V. Macpherson and P. R. Unwin, Anal. Chem. 73, 550 (2001).
8. C. Kranz, O. Friedbacher, B. Mizaikoff, A. Lugstein, J. Smoliner, and E. Bertagnolli, Anal. Chem. 73, 2491 (2001).
9. A. Lugstein, E. Bertagnolli, C. Kranz, A. Kueng, and B. Mizaikoff, Appl. Phys. Lett. 81, 349 (2002).
10. J. Kwak and A. J. Bard, Anal. Chem. 61, 1221 (1989).
11. C. Kranz, B. Mizaikoff, A. Lugstein, E. Bertagnolli, in Electrochemical Methods for the Environmental Analysis at Trace Element Biogeochemistry, American Chemical Society Symposium Vol. 320, edited by M. Taillefert and T. F. Rozan, 2002.
12. P. K Hansma, J. P. Cleveland, M. Radmacher, D. A. Walters, P. E. Hillner, M. Bezanilla, M. Fritz, D. Vie, H. G. Hansma, C. B. Prater, J. Massie, L. Fukunaga, J. Gurley, and V. Elings, Appl. Phys. Lett. 64, 1738 (1994).
13. C. A. J. Putman, K. O. van der Werf, B. G. De Grooth, N. F. Van Hulst, and J. Greve, Appl. Phys. Lett. 64, 2454 (1994).
14. Ch. Le Grimellec, M.-C. Giocondi, R. Pujol, and E. Lesniewska, Single Molecules 1, 105 (2000).
15. A. Knoll, R. Magerle, and G. Krausch, Macromolecules 34, 4159 (2001).
16. A. Lugstein, E. Bertagnolli, C. Kranz, and B. Mizaikoff, Surf. Interface Anal. 33, 146 (2002).
17. E. L. H. Heintz, C. Kranz, B. Mizaikoff, H.-S. Noh, P. Hesketh, A. Lugstein, and E. Bertagnolli, Proc. IEEE Nanotechnology Conference, 2001.
18. A. J. Bard and M. V. Mirkin, Scanning Electrochemical Microscopy (Marcel Dekker, New York, 2001), p. 145.
19. Y. Lee, S. Amemya, and A. J. Bard, Anal. Chem. 73, 2261 (2001).
20. C. Kranz, B. Mizaikoff, A. Lugstein, and E. Bertagnolli, PCT Patents pending, 2001.