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Volumn 77, Issue 2, 2005, Pages 424-434

Characterization of batch-microfabricated scanning electrochemical-atomic force microscopy probes

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEMODULATION; DIFFUSION; ELECTROCHEMISTRY; ELECTRODES; VOLTAGE MEASUREMENT;

EID: 12244308649     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac048930e     Document Type: Article
Times cited : (75)

References (53)
  • 34


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.