Conductive atomic force microscopy probes from pyrolyzed parylene

Journal of the Electrochemical Society

Volumn 159, Issue 7, 2012, Pages

  Morton, Kirstin C ^a   Derylo, Maksymilian A ^a   Baker, Lane A ^a  

^a INDIANA UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON MATERIAL; CONDUCTIVE AFM; CONDUCTIVE ATOMIC FORCE MICROSCOPY; CURRENT-SENSING ATOMIC FORCE MICROSCOPIES; FUTURE APPLICATIONS; METALLIC FEATURE; SCANNING ELECTROCHEMICAL-ATOMIC FORCE MICROSCOPIES; SILICON CANTILEVER;

ATOMIC FORCE MICROSCOPY; CONDUCTIVE MATERIALS;

PROBES;

EID: 84878234158     PISSN: 00134651     EISSN: 19457111     Source Type: Journal    
DOI: 10.1149/2.061207jes     Document Type: Article

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