Origins of nanoscale damage to glass-sealed platinum electrodes with submicrometer and nanometer size

Analytical Chemistry

Volumn 85, Issue 13, 2013, Pages 6198-6202

  Nioradze, Nikoloz ^a   Chen, Ran ^a   Kim, Jiyeon ^a,b   Shen, Mei ^a,c   Santhosh, Padmanabhan ^a,d   Amemiya, Shigeru ^a  

^a UNIVERSITY OF PITTSBURGH   (United States)

^b UNIVERSITY OF TEXAS AT AUSTIN   (United States)

^c UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^d DUBLIN INSTITUTE OF TECHNOLOGY   (Ireland)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROCHEMICAL MEASUREMENTS; ELECTROLYTE SOLUTIONS; ELECTROSTATIC CHARGES; ELECTROSTATIC DAMAGE; POTENTIOSTATIC CONTROL; SCANNING ELECTROCHEMICAL MICROSCOPY; VOLTAMMETRIC MEASUREMENTS; X-RAY ENERGY DISPERSIVE SPECTROSCOPY;

CYCLIC VOLTAMMETRY; ELECTROCHEMICAL ELECTRODES; ELECTROSTATIC DEVICES; ELECTROSTATICS; ENERGY DISPERSIVE SPECTROSCOPY; FREE RADICALS; GEOMETRY; GLASS; NANOTECHNOLOGY; SCANNING ELECTRON MICROSCOPY; SCANNING PROBE MICROSCOPY; VOLTAGE REGULATORS;

PLATINUM;

GLASS; PLATINUM;

ARTICLE; CHEMISTRY; ELECTROCHEMICAL ANALYSIS; ELECTRODE; METHODOLOGY; NANOTECHNOLOGY;

ELECTROCHEMICAL TECHNIQUES; ELECTRODES; GLASS; NANOTECHNOLOGY; PLATINUM;

EID: 84880009917     PISSN: 00032700     EISSN: 15206882     Source Type: Journal    
DOI: 10.1021/ac401316n     Document Type: Article

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