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Volumn 79, Issue 13, 2007, Pages 4769-4777

Batch fabrication of atomic force microscopy probes with recessed integrated ring microelectrodes at a wafer level

Author keywords

[No Author keywords available]

Indexed keywords

BATCH PROCESSING; REPRODUCIBILITY; SCANNING ELECTROCHEMICAL MICROSCOPY (SECM);

EID: 34447317288     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac070598u     Document Type: Article
Times cited : (43)

References (59)
  • 4
    • 34447305001 scopus 로고    scopus 로고
    • Shiku, H.; Ohya, H.; Matsue, T. In Encyclopedia of Electrochemistry, Wilson, G. S., Ed.; Wiley-VCH: Weinheim, 2002; 9, pp 257, 259-275.
    • Shiku, H.; Ohya, H.; Matsue, T. In Encyclopedia of Electrochemistry, Wilson, G. S., Ed.; Wiley-VCH: Weinheim, 2002; Vol. 9, pp 257, 259-275.
  • 5
    • 0003853137 scopus 로고    scopus 로고
    • Bard, A.J, Mirkin, M. V, Eds, Marcel Dekker, Inc, New York
    • Scanning Electrochemical Microscopy, Bard, A.J., Mirkin, M. V., Eds.; Marcel Dekker, Inc.: New York, 2001.
    • (2001) Scanning Electrochemical Microscopy


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.