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Volumn 73, Issue 3, 2001, Pages 550-557

Noncontact electrochemical imaging with combined scanning electrochemical atomic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

AMPEROMETRY; ARTICLE; ATOMIC FORCE MICROSCOPY; CONDUCTANCE; DIAGNOSTIC IMAGING; DIFFUSION; ELECTROCHEMICAL ANALYSIS; ELECTRODE; GEOMETRY; SCANNING ELECTRON MICROSCOPY; SENSOR; TOPOGRAPHY;

EID: 0035253692     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac001072b     Document Type: Article
Times cited : (143)

References (50)
  • 31


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.