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Volumn 13, Issue 1, 2011, Pages 78-81
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High-aspect ratio needle probes for combined scanning electrochemical microscopy - Atomic force microscopy
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Author keywords
AFM; Combined SECM AFM; Nanoscale electrochemistry; Needle probes; SECM
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Indexed keywords
AFM;
CHARACTERISATION;
DISK ELECTRODE;
HIGH RESOLUTION;
HIGH-ASPECT RATIO;
NANO SCALE;
NEEDLE PROBES;
SCANNING ELECTROCHEMICAL MICROSCOPY;
SECM;
TIP APEX;
ANALYTIC EQUIPMENT;
ASPECT RATIO;
ATOMIC FORCE MICROSCOPY;
ELECTROCHEMISTRY;
NANOSTRUCTURED MATERIALS;
NEEDLES;
SCANNING ELECTRON MICROSCOPY;
PROBES;
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EID: 78650549831
PISSN: 13882481
EISSN: None
Source Type: Journal
DOI: 10.1016/j.elecom.2010.11.018 Document Type: Article |
Times cited : (39)
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References (18)
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