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Volumn 13, Issue 1, 2011, Pages 78-81

High-aspect ratio needle probes for combined scanning electrochemical microscopy - Atomic force microscopy

Author keywords

AFM; Combined SECM AFM; Nanoscale electrochemistry; Needle probes; SECM

Indexed keywords

AFM; CHARACTERISATION; DISK ELECTRODE; HIGH RESOLUTION; HIGH-ASPECT RATIO; NANO SCALE; NEEDLE PROBES; SCANNING ELECTROCHEMICAL MICROSCOPY; SECM; TIP APEX;

EID: 78650549831     PISSN: 13882481     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elecom.2010.11.018     Document Type: Article
Times cited : (39)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.