Scanning electrochemical microscopy: Diffusion controlled approach curves for conical AFM-SECM tips

Electrochemistry Communications

Volumn 27, Issue , 2013, Pages 29-33

  Leonhardt, Kelly ^a   Avdic, Amra ^b   Lugstein, Alois ^b   Pobelov, Ilya ^c   Wandlowski, Thomas ^c   Gollas, Bernhard ^d,e   Denuault, Guy ^a  

^a UNIVERSITY OF SOUTHAMPTON   (United Kingdom)

^b VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^c UNIVERSITY OF BERN   (Switzerland)

^d CEST Competence Centre for Electrochemical Surface Technology   (Austria)

^e GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

AFM; Approach curve; Conical electrode; Diffusion control; SECM

Indexed keywords

AFM; APPROACH CURVE; DIFFUSION CONTROL; DIFFUSION CONTROLLED; EXPERIMENTAL APPROACHES; HINDERED DIFFUSION; PROBE CURRENTS; SCANNING ELECTROCHEMICAL MICROSCOPY; SECM; TIP RADIUS;

ASPECT RATIO; PROBES; SCANNING ELECTRON MICROSCOPY; SCANNING PROBE MICROSCOPY;

DIFFUSION;

EID: 84870341682     PISSN: 13882481     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elecom.2012.10.034     Document Type: Article

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