Electrochemical current-sensing atomic force microscopy in conductive solutions

Nanotechnology

Volumn 24, Issue 11, 2013, Pages

  Pobelov, Ilya V ^a   Mohos, Miklós ^a,b   Yoshida, Koji ^a   Kolivoska, Viliam ^a   Avdic, Amra ^c   Lugstein, Alois ^c   Bertagnolli, Emmerich ^c   Leonhardt, Kelly ^d   Denuault, Guy ^d   Gollas, Bernhard ^e,f   Wandlowski, Thomas ^a  

^a UNIVERSITY OF BERN   (Switzerland)

^b INSTITUTE OF EXPERIMENTAL MEDICINE   (Hungary)

^c VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^d UNIVERSITY OF SOUTHAMPTON   (United Kingdom)

^e GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

^f CEST Competence Centre for Electrochemical Surface Technology   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

BI-FUNCTIONAL; CONDUCTIVE SOLUTIONS; CONDUCTIVE TIPS; CURRENT SENSORS; CURRENT-SENSING ATOMIC FORCE MICROSCOPIES; ELECTROCHEMICAL POTENTIAL; ELECTROLYTE SOLUTIONS; SCANNING ELECTROCHEMICAL MICROSCOPY;

PROBES; SCANNING ELECTRON MICROSCOPY;

ATOMIC FORCE MICROSCOPY;

NANOPARTICLE;

ARTICLE; ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; METHODOLOGY; OXIDATION REDUCTION REACTION; SCANNING ELECTRON MICROSCOPY; SOLUTION AND SOLUBILITY; ULTRASTRUCTURE;

ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; MICROSCOPY, ATOMIC FORCE; MICROSCOPY, ELECTRON, SCANNING; NANOPARTICLES; OXIDATION-REDUCTION; SOLUTIONS;

EID: 84874846586     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/24/11/115501     Document Type: Article

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