Atomic force microscopy-scanning electrochemical microscopy: Influence of tip geometry and insulation defects on diffusion controlled currents at conical electrodes

Analytical Chemistry

Volumn 83, Issue 8, 2011, Pages 2971-2977

  Leonhardt, Kelly ^a   Avdic, Amra ^b   Lugstein, Alois ^b   Pobelov, Ilya ^c   Wandlowski, Thomas ^c   Wu, Ming ^d   Gollas, Bernhard ^d,e   Denuault, Guy ^a  

^a UNIVERSITY OF SOUTHAMPTON   (United Kingdom)

^b VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^c UNIVERSITY OF BERN   (Switzerland)

^d CEST Centre of Electrochemical Surface Technology   (Austria)

^e GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

3D SIMULATIONS; AFM; AFM PROBE; AMPEROMETRIC RESPONSE; DIFFUSION CONTROLLED; GENERAL EXPRESSION; GEOMETRICAL PARAMETERS; INSULATION DEFECTS; LIMITING CURRENT; NANO-ELECTRODES; NUMERICAL SIMULATION; SCANNING ELECTROCHEMICAL MICROSCOPY; SHEATH THICKNESS; STEADY STATE; TIP GEOMETRY;

ASPECT RATIO; ATOMIC FORCE MICROSCOPY; DEFECTS; ELECTROCHEMICAL ELECTRODES; GEOMETRY; PROBES; SCANNING ELECTRON MICROSCOPY; THREE DIMENSIONAL; THREE DIMENSIONAL COMPUTER GRAPHICS;

ANALYTIC EQUIPMENT;

EID: 79954455574     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac103083y     Document Type: Article

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