Combined scanning electrochemical-atomic force microscopy

Analytical Chemistry

Volumn 72, Issue 2, 2000, Pages 276-285

  Macpherson, Julie V ^a   Unwin, Patrick R ^a  

^a UNIVERSITY OF WARWICK   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; ATOMIC FORCE MICROSCOPY; CONDUCTOR; DIFFUSION; DISSOLUTION; ELECTROCHEMICAL ANALYSIS; OPTICAL RESOLUTION; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTY; ULTRAFILTRATION;

ELECTROCHEMISTRY; MEMBRANES, ARTIFICIAL; MICROSCOPY, ATOMIC FORCE; MICROSCOPY, ELECTRON, SCANNING; ULTRAFILTRATION;

EID: 0034650279     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac990921w     Document Type: Article

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