Characterization of microfabricated probes for combined atomic force and high-resolution scanning electrochemical microscopy

Analytical Chemistry

Volumn 78, Issue 15, 2006, Pages 5436-5442

  Gullo, Maurizio R ^a   Frederix, Patrick L T M ^a,b   Akiyama, Terunobu ^a   Engel, Andreas ^a,b   DeRooij, Nico F ^a   Staufer, Urs ^a  

^a UNIVERSITY OF NEUCHÂTEL   (Switzerland)

^b UNIVERSITY OF BASEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CYCLIC VOLTAMMETRY; DIFFUSION; ELECTROCHEMISTRY; FEEDBACK; FINITE ELEMENT METHOD; SCANNING ELECTRON MICROSCOPY;

ELECTROCHEMICAL RESOLUTION; SCANNING ELECTROCHEMICAL MICROSCOPES; STEADY-STATE CYCLIC VOLTAMMETRY;

ATOMIC FORCE MICROSCOPY;

PLATINUM; RUTHENIUM DERIVATIVE; SILICON NITRIDE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CYCLIC POTENTIOMETRY; DIFFUSION; ELECTROCHEMICAL ANALYSIS; ELECTRODE; GEOMETRY; MICROSCOPE; REDUCTION; REPRODUCIBILITY; SCANNING ELECTROCHEMICAL MICROSCOPY; STEADY STATE; TOPOGRAPHY;

EID: 33746815629     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac0521495     Document Type: Article

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