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Analytical Chemistry

Volumn 73, Issue 11, 2001, Pages 2491-2500

Integrating an ultramicroelectrode in an AFM cantilever: Combined technology for enhanced information

(6) Kranz, C a,b Friedbacher, G a Mizaikofft, B a,b Lugstein, A a Smoliner, J a Bertagnolli, E a

a VIENNA UNIVERSITY OF TECHNOLOGY (Austria)

b GEORGIA INSTITUTE OF TECHNOLOGY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SCANNING ELECTROCHEMICAL MICROSCOPY (SECM);

ATOMIC FORCE MICROSCOPY; ELECTROCHEMISTRY; ION BEAMS; SCANNING;

MICROELECTRODES;

ANALYTIC METHOD; ARTICLE; ELECTROCHEMISTRY; IMAGING; MICROELECTRODE; SCANNING PROBE MICROSCOPY; SURFACE PROPERTY;

EID: 0035356222 PISSN: 00032700 EISSN: None Source Type: Journal
DOI: 10.1021/ac001099v Document Type: Article

Times cited : (302)

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