High-resolution electrochemical and topographical imaging using batch-fabricated cantilever probes

Analytical Chemistry

Volumn 86, Issue 10, 2014, Pages 5143-5149

  Wain, Andrew J ^a   Pollard, Andrew J ^a   Richter, Christoph ^b  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^b NANOWORLD SERVICES GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

NANOCANTILEVERS; PROBES; SCANNING ELECTRON MICROSCOPY;

CANTILEVER PROBE; CHEMICAL CONTAMINANTS; EXFOLIATED GRAPHENE; FARADAIC CURRENT; GRAPHITE SAMPLES; TOPOGRAPHICAL FEATURES; TOPOGRAPHICAL IMAGING; TOPOGRAPHICAL INFORMATION;

ATOMIC FORCE MICROSCOPY;

EID: 84901249288     PISSN: 00032700     EISSN: 15206882     Source Type: Journal    
DOI: 10.1021/ac500946v     Document Type: Article

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