Combinational logic soft error correction

Proceedings - International Test Conference

Volumn , Issue , 2006, Pages

  Mitra, Subhasish ^a   Zhang, Ming ^b   Waqas, Saad ^b   Seifert, Norbert ^b   Gill, Balkaran ^b   Kim, Kee Sup ^b  

^a STANFORD UNIVERSITY   (United States)

^b INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMBINATORIAL CIRCUITS; COMPUTER SIMULATION; FLIP CHIP DEVICES; SEQUENTIAL CIRCUITS;

COMBINATIONAL LOGICS; LOGIC OUTPUTS; SIMULATION RESULTS; SOFT ERROR RATES;

ERROR CORRECTION;

EID: 84975095844     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2006.297681     Document Type: Conference Paper

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