-
2
-
-
0031208259
-
Design methodologies and circuit design trade-offs for the HP PA8000 processor
-
Aug.
-
P. Dorweiler, F. Moore, D. Josephson, and G. Colon-Bonet, "Design Methodologies And Circuit Design Trade-Offs For The HP PA8000 Processor", Hewlett Packard J., Aug. 1997.
-
(1997)
Hewlett Packard J.
-
-
Dorweiler, P.1
Moore, F.2
Josephson, D.3
Colon-Bonet, G.4
-
3
-
-
0030086011
-
A dual floating-point coprocessor with FMAC architecture
-
Feb.
-
C. Heikes and G. Colon-Bonet, "A Dual Floating-Point Coprocessor With FMAC Architecture," ISSCC Dig. Tech. Papers, pp. 354-355, Feb. 1995.
-
(1995)
ISSCC Dig. Tech. Papers
, pp. 354-355
-
-
Heikes, C.1
Colon-Bonet, G.2
-
4
-
-
84936893976
-
Using heavy-ion radiation to validate fault handling mechanisms
-
February
-
J. Karlsson, P. Ledan, P. Dahlgren, and R. Johansson, "Using Heavy-Ion Radiation to Validate Fault Handling Mechanisms", IEEE Micro, 14(1), pp. 8-23, February 1994.
-
(1994)
IEEE Micro
, vol.14
, Issue.1
, pp. 8-23
-
-
Karlsson, J.1
Ledan, P.2
Dahlgren, P.3
Johansson, R.4
-
5
-
-
0020298427
-
Collection of charge on junction nodes from ion tracks
-
G.C. Messenger, "Collection of charge on junction nodes from ion tracks", IEEE Trans. on Nuclear Science, pp. 2024-2031, 1982.
-
(1982)
IEEE Trans. on Nuclear Science
, pp. 2024-2031
-
-
Messenger, G.C.1
-
6
-
-
0142184763
-
Cost-effective approach for reducing soft error failure rate in logic circuits
-
K. Mohanram and N. A. Touba, "Cost-Effective Approach for Reducing Soft Error Failure Rate in Logic Circuits", Proc. Int'l Test Conf., pp. 893-901, 2003.
-
(2003)
Proc. Int'l Test Conf.
, pp. 893-901
-
-
Mohanram, K.1
Touba, N.A.2
-
7
-
-
84944403418
-
A systematic methodology to compute the architectural vulnerability factors for a high-perfbrmance microprocessor
-
S. S. Mukherjee, C. Weaver, J. Emer, S. K. Reinhardt, and T. Austin, "A Systematic Methodology to Compute the Architectural Vulnerability Factors for a High-Perfbrmance Microprocessor", Proc. IEEE/ACM MICRO, pp. 29-40, 2003.
-
(2003)
Proc. IEEE/ACM MICRO
, pp. 29-40
-
-
Mukherjee, S.S.1
Weaver, C.2
Emer, J.3
Reinhardt, S.K.4
Austin, T.5
-
8
-
-
0036858569
-
The Implementation of the Itanium 2 Microprocessor
-
November
-
S. D. Naffziger, G. Colon-Bonet, T. Fischer, R. Riedlinger, T. J. Sullivan, and T. Grutkowski, "The Implementation of the Itanium 2 Microprocessor", IEEE Journal Of Solid-State Circuits, Vol. 37, No. 11, pp. 1448-1460, November 2002.
-
(2002)
IEEE Journal of Solid-State Circuits
, vol.37
, Issue.11
, pp. 1448-1460
-
-
Naffziger, S.D.1
Colon-Bonet, G.2
Fischer, T.3
Riedlinger, R.4
Sullivan, T.J.5
Grutkowski, T.6
-
10
-
-
0036931372
-
Modeling the effect of technology trends on the soft error rate of combinatorial logic
-
P. Shivakumar, M. Kistler, S.W. Keckler, D. Burger, and L. Alvisi, "Modeling the Effect of Technology Trends on the Soft Error Rate of Combinatorial Logic", Proc. Int'l Conf. on Dependable Systems and Networks (DSN), pp. 389-398, 2002.
-
(2002)
Proc. Int'l Conf. on Dependable Systems and Networks (DSN)
, pp. 389-398
-
-
Shivakumar, P.1
Kistler, M.2
Keckler, S.W.3
Burger, D.4
Alvisi, L.5
-
11
-
-
0842290828
-
A transparent online memory test for simultaneous detection of functional faults and soft errors in memories
-
Dec.
-
K. Thaller and A. Steininger, "A Transparent Online Memory Test for Simultaneous Detection of Functional Faults and Soft Errors in Memories", IEEE Trans. on Reliability, Vol. 52, Issue 4, pp. 413-422, Dec. 2003.
-
(2003)
IEEE Trans. on Reliability
, vol.52
, Issue.4
, pp. 413-422
-
-
Thaller, K.1
Steininger, A.2
-
13
-
-
16244405890
-
Cost-effective radiation hardening technique for combinational logic
-
Q. Zhou and K. Mohanram, "Cost-Effective Radiation Hardening Technique for Combinational Logic", Proc. Int'l Conf. on Computer-Aided Design, pp. 100-106, 2004.
-
(2004)
Proc. Int'l Conf. on Computer-aided Design
, pp. 100-106
-
-
Zhou, Q.1
Mohanram, K.2
|