메뉴 건너뛰기




Volumn , Issue , 2005, Pages 454-462

A low power soft error suppression technique for dynamic logic

Author keywords

[No Author keywords available]

Indexed keywords

DELAY OVERHEAD; DYNAMIC LOGIC; SOFT-ERRORS; SUPPRESSION TECHNIQUE;

EID: 28444454859     PISSN: 15505774     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (16)

References (13)
  • 2
    • 0031208259 scopus 로고    scopus 로고
    • Design methodologies and circuit design trade-offs for the HP PA8000 processor
    • Aug.
    • P. Dorweiler, F. Moore, D. Josephson, and G. Colon-Bonet, "Design Methodologies And Circuit Design Trade-Offs For The HP PA8000 Processor", Hewlett Packard J., Aug. 1997.
    • (1997) Hewlett Packard J.
    • Dorweiler, P.1    Moore, F.2    Josephson, D.3    Colon-Bonet, G.4
  • 3
    • 0030086011 scopus 로고
    • A dual floating-point coprocessor with FMAC architecture
    • Feb.
    • C. Heikes and G. Colon-Bonet, "A Dual Floating-Point Coprocessor With FMAC Architecture," ISSCC Dig. Tech. Papers, pp. 354-355, Feb. 1995.
    • (1995) ISSCC Dig. Tech. Papers , pp. 354-355
    • Heikes, C.1    Colon-Bonet, G.2
  • 4
    • 84936893976 scopus 로고
    • Using heavy-ion radiation to validate fault handling mechanisms
    • February
    • J. Karlsson, P. Ledan, P. Dahlgren, and R. Johansson, "Using Heavy-Ion Radiation to Validate Fault Handling Mechanisms", IEEE Micro, 14(1), pp. 8-23, February 1994.
    • (1994) IEEE Micro , vol.14 , Issue.1 , pp. 8-23
    • Karlsson, J.1    Ledan, P.2    Dahlgren, P.3    Johansson, R.4
  • 5
    • 0020298427 scopus 로고
    • Collection of charge on junction nodes from ion tracks
    • G.C. Messenger, "Collection of charge on junction nodes from ion tracks", IEEE Trans. on Nuclear Science, pp. 2024-2031, 1982.
    • (1982) IEEE Trans. on Nuclear Science , pp. 2024-2031
    • Messenger, G.C.1
  • 6
    • 0142184763 scopus 로고    scopus 로고
    • Cost-effective approach for reducing soft error failure rate in logic circuits
    • K. Mohanram and N. A. Touba, "Cost-Effective Approach for Reducing Soft Error Failure Rate in Logic Circuits", Proc. Int'l Test Conf., pp. 893-901, 2003.
    • (2003) Proc. Int'l Test Conf. , pp. 893-901
    • Mohanram, K.1    Touba, N.A.2
  • 7
    • 84944403418 scopus 로고    scopus 로고
    • A systematic methodology to compute the architectural vulnerability factors for a high-perfbrmance microprocessor
    • S. S. Mukherjee, C. Weaver, J. Emer, S. K. Reinhardt, and T. Austin, "A Systematic Methodology to Compute the Architectural Vulnerability Factors for a High-Perfbrmance Microprocessor", Proc. IEEE/ACM MICRO, pp. 29-40, 2003.
    • (2003) Proc. IEEE/ACM MICRO , pp. 29-40
    • Mukherjee, S.S.1    Weaver, C.2    Emer, J.3    Reinhardt, S.K.4    Austin, T.5
  • 11
    • 0842290828 scopus 로고    scopus 로고
    • A transparent online memory test for simultaneous detection of functional faults and soft errors in memories
    • Dec.
    • K. Thaller and A. Steininger, "A Transparent Online Memory Test for Simultaneous Detection of Functional Faults and Soft Errors in Memories", IEEE Trans. on Reliability, Vol. 52, Issue 4, pp. 413-422, Dec. 2003.
    • (2003) IEEE Trans. on Reliability , vol.52 , Issue.4 , pp. 413-422
    • Thaller, K.1    Steininger, A.2
  • 13
    • 16244405890 scopus 로고    scopus 로고
    • Cost-effective radiation hardening technique for combinational logic
    • Q. Zhou and K. Mohanram, "Cost-Effective Radiation Hardening Technique for Combinational Logic", Proc. Int'l Conf. on Computer-Aided Design, pp. 100-106, 2004.
    • (2004) Proc. Int'l Conf. on Computer-aided Design , pp. 100-106
    • Zhou, Q.1    Mohanram, K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.