Design of adaptive nanometer digital systems for effective control of soft error tolerance

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2005, Pages 298-303

  Diril, A U ^a   Dhillon, Y S ^a   Chatterjee, A ^a   Singh, A D ^b  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^b AUBURN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATMOSPHERIC NEUTRONS; CONCURRENT ERROR DETECTION; NANOMETER CIRCUITS; RADIATION CONDITION; SOFT-ERROR TOLERANCE; SUPPLY-VOLTAGE SCALING; THRESHOLD VOLTAGE MODULATIONS; VARIABLE CAPACITANCES;

CAPACITANCE; ERROR CORRECTION; MICROPROCESSOR CHIPS;

VLSI CIRCUITS;

EID: 84886454976     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2005.40     Document Type: Conference Paper

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