Robust platform design in advanced VLSI technologies

Proceedings of the Custom Integrated Circuits Conference

Volumn 2005, Issue , 2005, Pages 23-30

  Leavins, David J ^a   Kim, Kee Sup ^a   Mitra, Subhasish ^a   Rodriguez, Eddie J ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN SELF TEST; DATA COMPRESSION; DESIGN FOR TESTABILITY; ERROR DETECTION; INTEGRATED CIRCUIT LAYOUT;

DESIGN FEATURES; EXPONENTIAL REDUCTION; TEST COMPRESSION TECHNIQUES; TEST DATA VOLUME;

VLSI CIRCUITS;

EID: 33847160410     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CICC.2005.1568599     Document Type: Conference Paper

References (21)

1. Baumann, R., "The Impact of Technology Scaling on Soft Error Rate Performance and Limits to the Efficacy of Error Correction," Proc. Intl. Electron Devices Meeting, pp. 329 - 332, 2002.
2. Borkar, S., "Microarchitecture and Design Challenges for Gigascale Integration," Keynote Speech, Intl. Symp. Microarchitecture, 2004.
3. Calin, T., M. Nicolaidis, and R. Velaco, "Upset Hardened Memory Design for Submicron CMOS Technology," IEEE Trans. Nucl. Sci., Vol. 43, pp. 2874-2878, Dec. 1996.
4. Carbine, A. and D. Feltham, "Pentium Pro Processor Design for Test and Debug," Proc. Intl. Test Conf, pp. 294-303, 1999.
5. Kuppuswamy, R. et al., "Full Hold-Scan Systems in Microprocessors: Cost/Benefit Analysis," Intel Technology Journal, Vol. 18, No. 1, Feb. 2004.
6. Lovellette, M.N., et al. "Strategies for faulttolerant, space-based computing: Lessons learned from the ARGOS testbed," Proc. Aerospace Conf. pp. 5-2109 - 5-2119, 2002.
7. Lumetta, S.S., and S. Mitra, "X-Codes: Error Control with Unknowable Inputs," IEEE Intl. Symp. Information Theory, p. 102, 2003.
8. Lumetta, S.S., and S. Mitra, "X-Codes: Error Control with Unknowable Inputs," Technical Report, Center for Reliable and High-Performance Computing, University of Illinois at Urbana-Champaign, CRHC-03-08 (also UILU-ENG-03-2217), August 2003..
9. McCluskey, E.J., et al., "Test Compression-Roundtable," IEEE Design and Test of Computers, Vol. 20, Issue 2, pp. 76-87, March-April, 2003.
10. Mitra, S., and K.S. Kim, "X-Compact: An Efficient Response Compaction Technique for Test Cost Reduction," Proc. Intl. Test Conf., pp. 311-320, 2002.
11. Mitra, S., and K.S. Kim, "XMAX: X-Tolerant Architecture for Maximal Test Compression," Proc. Intl. Conf. Computer Design, pp. 311-320, 2003.
12. Mitra, S., and K.S. Kim, "X-Compact: An Efficient Response Compaction Technique," IEEE Trans. Computer-Aided Design, Vol. 23, Issue 3, pp. 421-432, March 2004.
13. Mitra, S., S. Lumetta and M. Mitzenmacher, "X-Tolerant Signature Analysis," IEEE Intl. Test Conf., pp. 432-441, 2004.
14. Mitra, S., N. Seifert, M. Zhang, Q. Shi and K.S. Kim, "Robust System Design with Built-In Soft Error Resilience," IEEE Computer, Vol. 38, No. 2, pp. 43-52, Feb. 2005.
15. Mitra, S., and K.S. Kim, "XPAND: An Efficient Test Stimulus Compression Technique," IEEE Trans. Computers, Special Issue on Design and Test of Systems-on-a-Chip, July 2006, to appear.
16. Mukherjee, S.S., M. Kontz and S. Reinhardt, "Detailed Design and Evaluation of Redundant Multithreading Alternatives,"Intl. Symp. Computer Architecture, 2002.
17. Nguyen, H.T., and Y. Yagil, "A Systematic Approach to SER Estimation and Solutions", Proc. Intl. Reliability Physics Symp., pp. 60 - 70, 2003.
18. Saxena, N.R., et al., "Dependable Computing and On-line Testing in Adaptive and Reconfigurable Systems," IEEE Design and Test of Computers, pp. 29-41, Jan-Mar 2000.
19. Spainhower, L., and T. A. Gregg, "S/390 Parallel Enterprise Server G5 Fault Tolerance," IBM Journal Research & Development, pp. 863-873, Sept./Nov. 1999.
20. Oh, N., P.P. Shirvani and E.J. McCluskey, "Error Detection by Duplicated Instructions in Super-Scalar Processors," IEEE Trans. Reliability, pp. 63-75, March 2002.
21. Wang, N.J., et al., "Characterizing the Effects of Transient Faults on a High-Performance Processor Pipeline," Intl. Conf. Dependable Systems and Networks, pp. 61-70, 2004.