A systematic approach to SER estimation and solutions

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 2003, Pages 60-70

  Nguyen, Hang T ^a   Yagil, Yoad ^b  

^a INTEL CORPORATION   (United States)

^b INTEL CORPORATION   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER ARCHITECTURE; ERRORS; FLIP FLOP CIRCUITS; REDUNDANCY;

SOFT ERROR RATE (SER);

COMBINATORIAL CIRCUITS;

EID: 0038310282     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

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