A Soft Error Rate Analysis (SERA) methodology

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD

Volumn , Issue , 2004, Pages 111-118

  Zhang, Ming ^a   Shanbhag, Naresh R ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LATCHING WINDOW; MEMORY CIRCUITS; MICROSYSTEMS; SOFT ERROR RATE ANALYSIS (SERA) METHODOLOGY;

COMBINATORIAL CIRCUITS; COMPUTER SIMULATION; ELECTRON MULTIPLIERS; ERROR ANALYSIS; GRAPH THEORY; MONTE CARLO METHODS; PROBABILITY; STATIC RANDOM ACCESS STORAGE; TOPOLOGY;

LOGIC CIRCUITS;

EID: 16244391105     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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