Optically induced forces in scanning probe microscopy

Nanophotonics

Volumn 3, Issue 1-2, 2014, Pages 105-116

  Kohlgraf Owens, Dana C ^a   Sukhov, Sergey ^a   Greusard, Léo ^b   De Wilde, Yannick ^b   Dogariu, Aristide ^a  

^a UNIVERSITY OF CENTRAL FLORIDA   (United States)

^b INSTITUT LANGEVIN   (France)

Author keywords

Atomic force microscopy (AFM); Kelvin probe force microscopy (KPFM); Near field optics; Near field scanning optical microscopy (NSOM); Optical forces; Opto mechanical resonator; Opto mechanics; Scanning near field optical microscopy (SNOM); Scanning probe microscopy (SPM)

Indexed keywords

ATOMIC FORCE MICROSCOPY; HYDROPHOBICITY; LIGHT; OPTICAL DATA STORAGE; OPTICAL MICROSCOPY; PHOTODETECTORS; PHOTOMULTIPLIERS; SCANNING PROBE MICROSCOPY; TERAHERTZ WAVES;

KELVIN PROBE FORCE MICROSCOPY; NEAR FIELD OPTICS; OPTICAL FORCE; OPTO-MECHANICS; OPTOMECHANICAL;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 84921407716     PISSN: None     EISSN: 21928614     Source Type: Journal    
DOI: 10.1515/nanoph-2013-0056     Document Type: Article

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