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Physical Review B - Condensed Matter and Materials Physics

Volumn 85, Issue 19, 2012, Pages

Model-based extraction of material properties in multifrequency atomic force microscopy

(4) Forchheimer, Daniel a Platz, Daniel a Tholén, Erik A b Haviland, David B a

a ROYAL INSTITUTE OF TECHNOLOGY (Sweden)

b Intermodulation Products AB (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84861707952 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.85.195449 Document Type: Article

Times cited : (66)

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