Detection of pulsed far-infrared and terahertz light with an atomic force microscope

Applied Physics Letters

Volumn 101, Issue 14, 2012, Pages

  Ortega, J M ^a   Glotin, F ^a   Prazeres, R ^a   Berthet, J P ^a   Dazzi, A ^a  

^a UNIVERSITÉ PARIS SACLAY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPE (AFM); BI-LAYER; FAR-INFRARED; GRAPHITE LAYERS; HELIUM COOLED DETECTORS; INFRARED SPECTRUM; OSCILLATION AMPLITUDE; ROOM TEMPERATURE; SPECTRAL RANGE; TERAHERTZ LIGHT; THERMAL EXPANSION COEFFICIENTS;

HELIUM; IRRADIATION;

ATOMIC FORCE MICROSCOPY;

EID: 84867532815     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4757606     Document Type: Article

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