Multifrequency imaging in the intermittent contact mode of atomic force microscopy: Beyond phase imaging

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Volumn 8, Issue 8, 2012, Pages 1264-1269

  Guo, Senli ^a   Solares, Santiago D ^b   Mochalin, Vadym ^c   Neitzel, Ioannis ^c   Gogotsi, Yury ^c   Kalinin, Sergei V ^a   Jesse, Stephen ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF MARYLAND   (United States)

^c Drexel University   (United States)

Author keywords

atomic force microscopy; diamond; nanoparticles; phase imaging; scanning probe microscopy

Indexed keywords

AMBIENT ENVIRONMENT; BROAD BANDS; DIAMOND NANOPARTICLES; FUNCTIONALIZATIONS; FUNCTIONALIZED; GENERALIZED PHASE; HIGH-RESOLUTION IMAGING; IMAGE CONTRASTS; INTERMITTENT CONTACT MODES; MICA SUBSTRATES; MULTI FREQUENCY; NANO-DIAMOND PARTICLES; OCTADECYLAMINES; OUTPUT VARIABLES; PHASE IMAGING; QUALITY FACTORS; RESONANCE FREQUENCIES; RESPONSE AMPLITUDES; SINGLE-FREQUENCY; TIP-SURFACE INTERACTION;

ATOMIC FORCE MICROSCOPY; DIAMONDS; MICA; NANODIAMONDS; NANOPARTICLES; SCANNING PROBE MICROSCOPY;

NATURAL FREQUENCIES;

ARTICLE; ATOMIC FORCE MICROSCOPY; METHODOLOGY; SCANNING PROBE MICROSCOPY;

MICROSCOPY, ATOMIC FORCE; MICROSCOPY, SCANNING PROBE;

EID: 84859837350     PISSN: 16136810     EISSN: 16136829     Source Type: Journal    
DOI: 10.1002/smll.201101648     Document Type: Article

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